X-RAY SENSING OF SOLUTION-GROWN PURE AND DOPED MERCURIC IODIDE CRYSTALS

Abstract

This research paper investigates the X-ray sensing properties of solution-grown pure and doped crystals of mercuric iodide (HgI2). The study focuses on the growth of crystals, characterization and evaluation as room-temperature X-ray detectors. Various dopants, including copper (Cu), silver (Ag), and lead (Pb), were introduced during the crystal growth process to enhance the sensing capabilities of HgI2. The crystals were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS). The X-ray sensing performance was evaluated by measuring the current-voltage (I-V) characteristics, spectral response and detection efficiency. The results demonstrate that doped HgI2 crystals exhibit improved X-ray sensing properties compared to pure HgI2, with Cu-doped crystals showing the most promising performance. This study contributes to the development of high-performance, room-temperature X-ray detectors for various applications, including medical imaging, security screening, and industrial inspection. Keywords: X-ray diffraction (XRD, copper (Cu), silver (Ag), and lead (Pb).